JTAG opto coupled parallel I/O module

The BSPIO-OPTO1212 provides parallel-scan controlled access to up to 24 optically isolated electrical lines for driving up to 12 signal inputs or sensing up to 12 signal outputs. This module adds to the JTAG fixtures the capability to handle lines without common ground. The output cell has 3 terminals on the output transistor, one on the emitter (E), and two that share the collector with a different series resistance (R and CR). The output cell is protected from overcurrent and provides feedback for the self test. The input cell has 3 terminals on the input diode, one on the anode (A), and two that share the cathode with different series resistance (R and KR). The input cell is protected from overcurrent and has an integrated driver for the self test.

Features:

• 12 Optoisolated input channels
• 12 Optoisolated output channels
• High reliabilty DIN41612 I/O connector
• Reliable screw lock brackets
• Size 122mm X 70mm
• I/O organized in 1 segment
• 96 bit Boundary-scan Register Length
• Each segment can be independently bypassed
• Medium-speed 10MHz TCK for high reliability at the best cost/performance ratio
• Fully-compatible JTAG/IEEE 1149.1 Test Access Port (TAP)
• Operating power 3.3V, 5.0V
• Optional LVDS TCK interface can be used in large fixtures to avoid noise and skew problems.
   

The BSPIO-OPTO1212 is available in two basic versions, both of them compatible with standard DIN41612 female connectors in a test fixture. One version, the BSPIO-OPTO1212-A1, is primarily intended for test fixtures with few BSPIOs, and contains a standard TTL interface on the TAP’s TCK signal. This module facilitates boundary-scan interconnection testing using a direct connection to the JTAG/IEEE 1149.1 Test Access Port (TAP). The other version, the BSPIO-OPTO1212-A2, is intended for test fixtures with many BSPIOs and contains a balanced LVDS interface on the TAP’s TCK signal. This module facilitates boundary-scan interconnection testing using a small interface connection to a JTAG/IEEE 1149.1 TAP. All BSPIO I/O interfaces have an internal loopback for self test capability

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